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2015.198969.Investigation-Of-Interface-States-And-Radiation-Defects-In-Si-Sio2-In2o3-E-beam-Deposited-Structures-By-Optical-Mos-Admittance-Technique.pdf

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2015.198969.Investigation-Of-Interface-States-And-Radiation-Defects-In-Si-Sio2-In2o3-E-beam-Deposited-Structures-By-Optical-Mos-Admittance-Technique.pdf
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2015.198969.Investigation-Of-Interface-States-And-Radiation-Defects-In-Si-Sio2-In2o3-E-beam-Deposited-Structures-By-Optical-Mos-Admittance-Technique_jp2.zip
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